Sampling, wavelets, and tomography
Material type: TextLanguage: English Series: Applied and numerical harmonic analysisPublication details: Birkhauser, Boston, 2004 Description: xxi, 344pISBN: 9780817643041Subject(s): Harmonic analysis | Wavelets (Mathematics) | Fourier analysisDDC classification: 515.2433 SAMItem type | Current library | Call number | Materials specified | Copy number | Status | Date due | Barcode | Item holds |
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Books | Central Library | 515.2433 SAM (Browse shelf(Opens below)) | 1 | Available | 4170 |
Total holds: 0
8099/02-05-08
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