Welcome to the Online Catalogue, 

Central Library

Ramakrishna Mission Vivekananda Educational and Research Institute (RKMVERI), Belur
       
                       Accredited by NAAC with A++  Grade 
Amazon cover image
Image from Amazon.com

Sampling, wavelets, and tomography

By: John J. Benedetto [ed.]Contributor(s): Ahmed I. Zayed [ed.]Material type: TextTextLanguage: English Series: Applied and numerical harmonic analysisPublication details: Birkhauser, Boston, 2004 Description: xxi, 344pISBN: 9780817643041Subject(s): Harmonic analysis | Wavelets (Mathematics) | Fourier analysisDDC classification: 515.2433 SAM
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Materials specified Copy number Status Date due Barcode Item holds
Books Books Central Library
515.2433 SAM (Browse shelf(Opens below)) 1 Available 4170
Total holds: 0

8099/02-05-08

There are no comments on this title.

to post a comment.
Visitor count :